Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup …

Nanotomography, much like its related modalities tomography and microtomography, uses x-rays to create cross-sections from a 3D-object that later can be used to recreate a virtual model without destroying the original model, applying Nondestructive testing. …

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm …