Annular dark-field imaging is a method of mapping samples in a scanning transmission electron microscope (STEM). These images are formed by collecting scattered electrons with an annular dark-field detector.Conventional TEM dark-field imaging uses an objective …
Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup …
KIT on STEM-DPC
Hereon on DPC
In electron energy loss spectroscopy (EELS) a material is exposed to a beam of electrons with a known, narrow range of kinetic energies. Some of the electrons will undergo inelastic scattering, which means that they …
Electron tomography (ET) is a tomography technique for obtaining detailed 3D structures of sub-cellular, macro-molecular, or materials specimens. Electron tomography is an extension of traditional transmission electron microscopy and uses a transmission electron microscope to …
An element map is an image showing the spatial distribution of elements in a sample. Because it is acquired from a polished section, it is a 2D section through the unknown sample. Element maps are …
Energy-dispersive X-ray diffraction (EDXRD) is an analytical technique for characterizing materials. It differs from conventional X-ray diffraction by using polychromatic photons as the source and is usually operated at a fixed angle. With no need …
Energy-filtered transmission electron microscopy (EFTEM) is a technique used in transmission electron microscopy, in which only electrons of particular kinetic energies are used to form the image or diffraction pattern. The technique can be used …
High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples. It is a powerful tool to study properties of materials on …
Applications of momentum-resolved STEM cover a broad spectrum: Combined with aberration-corrected electron optics, subatomic electric fields and charge densities can be measured down to a spatial resolution of 50pm in thin specimen. The access to …
Employing an aberration corrector in a high-resolution transmission electron microscope, the spherical aberration CS can be tuned to negative values, resulting in a novel imaging technique, which is called the negative CS imaging (NCSI) technique. …
In microscopy, negative staining is an established method, often used in diagnostic microscopy, for contrasting a thin specimen with an optically opaque fluid. In this technique, the background is stained, leaving the actual specimen untouched, …
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A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, …
HZDR on SEM and Department of Analytics
HZB on SEM
KIT Laboratory for Electron Microscopy / Service / Scanning ELectron Microscopy
HZI Central Facility for Microscopy
GFZ Potsdam Imaging and Spectral Analysis (PISA) …
A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a …
KIT / Laboratory for Electron Microscopy / Service / TEM and STEM
Spectroscopy is the field of study that measures and interprets the electromagnetic spectra that result from the interaction between electromagnetic radiation and matter as a function of the wavelength or frequency of the radiation. Matter …
DESY Spectroscopy of Molecular Processes (FS-SMP) group
KIT on Quantum Optics & Spectroscopy
Department Locally-Sensitive & Time-Resolved Spectroscopy HZB
The CoreLab: Correlative Microscopy and Spectroscopy (CCMS) at HZB
Department of Spectroscopy (FWIH), HZDR …
Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm …
In transmission electron microscopy an electron beam is going through a very thin sample (usually < 100 nm thick). Due to the shorter wavelength of the electrons a far higher resolution can be obtained as …
