Summary of the MR capabilities

High Field

Magnet & console

• 11.7 T field strength
• 89 cm bore (wide-bore)
• Bruker AVANCE III console

RF channels

• 3x 1H / 19F
• 2x X
• 1x 2H

Probes

Micro5 microimaging …

Auger electron spectroscopy (AES) is used to determine the elemental composition and, in many cases, the chemical state of the atoms in the surface region of a solid, vacuum stable, not insulating material. AES has …

Equipment

STOE StadiVari goniometer
DECTRIS PILATUS pixel detector (300 K)
Microfoci X-ray sources (Cu- and Mo-radiation)

FEI Strata 400 DualBeam FIB equipped with an Omniprobe micromanipulator, Oxford EDX system and GIS (Pt, W, C, SiO2).

The Tecnai F20 is a S/TEM microscope.

Tescan Solaris X DualBeam FIB equipped with Omniprobe micromanipulator and option for 3D Slice&View and TEM sample preparation.
The Tescan Solaris X, is a combination of a scanning electron microscope (SEM) and a focused ion …

ThermoFischer Themis 300

Probe Corrected (S)TEM

Configuration

• High Tension: 80, 200, 300 kV
• X-FEG
• Aberration corrected (STEM)
• BF-/seg. DF-/HAADF-STEM detector
• Super-X EDX detector
• Dectris pixelated detector
• NanoMegas ASTAR system

Resolution

300 kV

Point Resolution TEM …

Double Corrected Analytical (S)TEM

Configuration

• High Tension: 60, 80, 300 kV
• X-FEG
• Monochromator
• Double aberration corrected (TEM and STEM)
• Super-X EDX detector
• BF-/seg. DF-/HAADF-STEM detector
• Gatan Oneview IS camera
• Gatan GIF Continuum 970 HighRes + …

The Xradia Ultra 810 is an X-ray microscope enabling the non-destructive structural characterization of three-dimensional samples with resolution down to 50 nm.

The Zeiss Auriga 60 Dual Beam FIB is a combination of a scanning electron microscope (SEM) and a focused ion beam (FIB) system, which allows imaging and structuring of materials at the nanoscale. It is …

The Zeiss ORION NanoFab is a microscope with sub-nanometer resolution. It is operated with He and Ne ion beams.

Since late 2016, the Institute for Applied Materials (KIT) has an X-ray microscope (Xradia 520 Versa) with sub-μm resolution for 3D X-ray microscopy, which offers a spatial resolution below 0.7 µm with available voxel sizes …

NanoCT (Xradia Ultra 810 X-ray microscope) enables the non-destructive structural characterization of three-dimensional samples with resolution down to 50 nm. In this non-invasive X-ray microscopy technique, the sample is positioned in the focal spot of …