Cryo-EM sample preparation tool with extended run time and enhanced automation.
Thermo Fischer on Aquilos 2
FEI Strata 400 DualBeam FIB equipped with an Omniprobe micromanipulator, Oxford EDX system and GIS (Pt, W, C, SiO2).
A combination of Plasma FIB and field-free UHR FE-SEM for multiscale materials characterization
Tescan on Amber X
Tescan Solaris X DualBeam FIB equipped with Omniprobe micromanipulator and option for 3D Slice&View and TEM sample preparation.The Tescan Solaris X, is a combination of a scanning electron microscope (SEM) and a focused ion …
The Zeiss Auriga 60 Dual Beam FIB is a combination of a scanning electron microscope (SEM) and a focused ion beam (FIB) system, which allows imaging and structuring of materials at the nanoscale. It is …
