related instruments to Focused ion beam scanning electron microscopy
Cryo-EM sample preparation tool with extended run time and enhanced automation.
FEI Strata 400 DualBeam FIB equipped with an Omniprobe micromanipulator, Oxford EDX system and GIS (Pt, W, C, SiO2).
A combination of Plasma FIB and field-free UHR FE-SEM for multiscale materials characterization
Tescan Solaris X DualBeam FIB equipped with Omniprobe micromanipulator and option for 3D Slice&View and TEM sample preparation.
The Tescan Solaris X, is a combination of a scanning electron microscope (SEM) and a focused ion …