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related instruments to 4D scanning transmission electron microscopy

Instrument
Themis 300

ThermoFischer Themis 300

Probe Corrected (S)TEM

Configuration

  • High Tension: 80, 200, 300 kV
  • X-FEG
  • Aberration corrected (STEM)
  • BF-/seg. DF-/HAADF-STEM detector
  • Super-X EDX detector
  • Dectris pixelated detector
  • NanoMegas ASTAR system

Resolution

300 kV

Point Resolution TEM …

In Helmholtz Imaging Modalities
➤Modalities: 7    ➤Applications: 7    ➤Experts: 1    ➤Labs: 0    ➤Facilities: 1    ➤Centers: 1    ➤Solutions: 5   

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