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related instruments to Scanning Electron Microscopy

Instrument
Aquilos 2 (Thermo Scientific)

Cryo-EM sample preparation tool with extended run time and enhanced automation.

Thermo Fischer on Aquilos 2

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Instrument
Bruker AXS QUANTAX 200

EDX: Bruker AXS QUANTAX 200

  • Light element detector X-Flash 4010
  • Energy resolution 127 eV

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Instrument
FEI Helios NanoLab 400S FIB-SEM (FIB 400)

The FEI Helios NanoLab 400S FIB-SEM is one of the world’s most advanced DualBeamTM focused ion beam (FIB) platforms for transmission electron microscopy (TEM) sample preparation, scanning electron microscopy (SEM) imaging and analysis in semiconductor …

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Instrument
FEI Quanta 250 FEG

Scanning electron microscope

Data Sheet for FEI Quanta 250 FEG from www.biotech.iastate.edu

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Instrument
FEI Titan G2 80-200 ChemiSTEM (ChemiSTEM)

The FEI Titan G2 80-200 ChemiSTEM is a fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale …

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Instrument
Nova Nano SEM 450

High resolution field emission SEM (Nova Nano SEM 450, FEI Thermofisher)

Detectors:
• SE Everhart-Thornley detector (ETD)
• Low vacuum BE detector
• High resolution through-lens detector tunable for SE and BE mode
• High …

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Instrument
Scanning Electron Microscope (SEM/EDX)

Field-emitting scanning electron microscope with Bruker Quantax XFlash Flat Quad energy-dispersive X-ray spectrometer.

high-resolution imaging (SE, BSE, STEM)
elemental nano-analytics

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Instrument
SEM Zeiss EVO 50

Description:
- Tungsten cathode
- Acceleration voltage 0.2 - 30 kV
- Resolution: 3 nm at 30 kV
- Detectors:
- Everhart-Thornley secondary electron detector
- 4 quadrant backscatter electron detector
- Chamber: diameter: 365 …

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Instrument
Strata 400 FIB (Strata 400)

FEI Strata 400 DualBeam FIB equipped with an Omniprobe micromanipulator, Oxford EDX system and GIS (Pt, W, C, SiO2).

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Instrument
Tecnai F20 ST

The Tecnai F20 is a S/TEM microscope.

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Instrument
TESCAN Amber X

A combination of Plasma FIB and field-free UHR FE-SEM for multiscale materials characterization

Tescan on Amber X

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Instrument
Tescan Solaris X (Solaris X)

Tescan Solaris X DualBeam FIB equipped with Omniprobe micromanipulator and option for 3D Slice&View and TEM sample preparation.
The Tescan Solaris X, is a combination of a scanning electron microscope (SEM) and a focused ion …

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Instrument
Themis-Z

Double Corrected Analytical (S)TEM

Configuration

  • High Tension: 60, 80, 300 kV
  • X-FEG
  • Monochromator
  • Double aberration corrected (TEM and STEM)
  • Super-X EDX detector
  • BF-/seg. DF-/HAADF-STEM detector
  • Gatan Oneview IS camera
  • Gatan GIF Continuum 970 HighRes + …

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Instrument
Zeiss Auriga 60 (Auriga 60)

The Zeiss Auriga 60 Dual Beam FIB is a combination of a scanning electron microscope (SEM) and a focused ion beam (FIB) system, which allows imaging and structuring of materials at the nanoscale. It is …

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Instrument
Zeiss EVO 10

scanning electron microscope

Zeiss on EVO 10

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Instrument
Zeiss Leo 1550 VP

This Scanning Electron Microscope is operated at Hereon.

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Instrument
Zeiss Merlin VP (Leipzig)

The Zeiss Merlin VP is a scanning electron microscope.

Download description from UFZ

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Instrument
Zeiss Merlin VP Compact (SEM/EDX)

Field-emitting scanning electron microscope with Bruker Quantax XFlash Flat Quad energy-dispersive X-ray spectrometer.

high-resolution imaging (SE, BSE, STEM)
elemental nano-analytics

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Instrument
Zeiss Supra 40VP

Scanning Electron Microscope

Zeiss on Supra

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