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related instruments to Karlsruher Institut für Technologie

Instrument
Auger electron spectroscope

The Auger electron spectroscope is operated by the Laboratory for Microscopy and Spectroscopy at the Karlsruhe Nano Micro Facility.

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Instrument
Bio-Rad 170-8195MP

The Gel electrophoresis and imaging system is operated by the Bio Lab.

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Instrument
Bruker 7 T-magnet

Preclinical MRI instruments, at KIT/IMT (Institute of Microstructure Technology)

Bruker Page on 7T

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Instrument
Bruker Dimension Icon @Cleanroom

Atomic Force Microscope

Bruker on Dimension Icon

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Instrument
Bruker Dimension Icon @Lab

Atomic Force Microscope

Bruker on Dimension Icon

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Instrument
Bruker X500

Contour X-500 Optical Profilometer for fast, non-contact 3D surface metrology

Bruker on X500

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Instrument
Dataphysics OCA20

Optical contact angle measuring and contour analysis system

Dataphysics on OCA20

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Instrument
Excillum, In/Ga liquid anode source

home-lab X-ray source

Excillum on metaljet-d2

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Instrument
Laser Assisted Wide Angle Tomographic Atom Probe (LAWATAP)

This instrument is part of the 3D Atom Probe Tomography (APT) operated at Karlsruhe Nano Micro Facility (KNMFi).

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Instrument
LEAP 4000X HR

Atom probe tomography is a technique for analyzing the chemical composition of a sample with atomic resolution.

See also

Manufactor description

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Instrument
Leica DMI 6000B

The inverted visible light microscope is operated by the Bio Lab.

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Instrument
Leica Z16 APO

The stereoscope is operated by the Bio Lab.

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Instrument
Mahr Marsurf CM select

Confocal microscope for the three-dimensional measurement and analysis of surfaces

Mahr on Marsurf CM select

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Instrument
Nuclear Magnetic Resonance imaging (NMR)

Summary of the MR capabilities

High Field

Magnet & console

  • 11.7 T field strength
  • 89 cm bore (wide-bore)
  • Bruker AVANCE III console

RF channels

  • 3x 1H / 19F
  • 2x X
  • 1x 2H

Probes

Micro5 microimaging …

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Instrument
OceanOptics HDX-XR

Spectrometer

OceanOptics on HDX-XR

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Instrument
SAM - Scanning Auger Microscope (SAM)

Auger electron spectroscopy (AES) is used to determine the elemental composition and, in many cases, the chemical state of the atoms in the surface region of a solid, vacuum stable, not insulating material. AES has …

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Instrument
Single Crystal X-ray Diffraction Microscope (SCXD)

Equipment

STOE StadiVari goniometer
DECTRIS PILATUS pixel detector (300 K)
Microfoci X-ray sources (Cu- and Mo-radiation)

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Instrument
Strata 400 FIB (Strata 400)

FEI Strata 400 DualBeam FIB equipped with an Omniprobe micromanipulator, Oxford EDX system and GIS (Pt, W, C, SiO2).

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Instrument
Tecnai F20 ST

The Tecnai F20 is a S/TEM microscope.

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Instrument
Tescan Solaris X (Solaris X)

Tescan Solaris X DualBeam FIB equipped with Omniprobe micromanipulator and option for 3D Slice&View and TEM sample preparation.
The Tescan Solaris X, is a combination of a scanning electron microscope (SEM) and a focused ion …

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Instrument
Themis 300

ThermoFischer Themis 300

Probe Corrected (S)TEM

Configuration

  • High Tension: 80, 200, 300 kV
  • X-FEG
  • Aberration corrected (STEM)
  • BF-/seg. DF-/HAADF-STEM detector
  • Super-X EDX detector
  • Dectris pixelated detector
  • NanoMegas ASTAR system

Resolution

300 kV

Point Resolution TEM …

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Instrument
Themis-Z

Double Corrected Analytical (S)TEM

Configuration

  • High Tension: 60, 80, 300 kV
  • X-FEG
  • Monochromator
  • Double aberration corrected (TEM and STEM)
  • Super-X EDX detector
  • BF-/seg. DF-/HAADF-STEM detector
  • Gatan Oneview IS camera
  • Gatan GIF Continuum 970 HighRes + …

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Instrument
Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS)

The instrument is operated by the Laboratory for Microscopy and Spectroscopy from KIT.

Features

  • Bi/Mn Source (Bi+, Bi3+, Bi3++, Mn+)
  • Mass resolution: up to 11000 m/Δm @ 29 amu (bunched mode)
  • Spatial resolution < 150 …

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Instrument
UHV-Cryo

The microscope is operated by the IMAGING Cluster at Karlsruhe Institute of Technology.

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Instrument
Xradia Ultra 810

The Xradia Ultra 810 is an X-ray microscope enabling the non-destructive structural characterization of three-dimensional samples with resolution down to 50 nm.

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Instrument
Zeiss Auriga 60 (Auriga 60)

The Zeiss Auriga 60 Dual Beam FIB is a combination of a scanning electron microscope (SEM) and a focused ion beam (FIB) system, which allows imaging and structuring of materials at the nanoscale. It is …

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Instrument
Zeiss AXIO Imager.M2m

Open Microscope System for Automated Material Analysis​

Zeiss on AXIO Imager.M2m

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Instrument
Zeiss Axioscope 7

Microscope for most common optical imaging requirements of materials laboratories

Zeiss on Axioscope 7

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Instrument
Zeiss EVO 10

scanning electron microscope

Zeiss on EVO 10

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Instrument
Zeiss Orion NanoFab

The Zeiss ORION NanoFab is a microscope with sub-nanometer resolution. It is operated with He and Ne ion beams.

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Instrument
Zeiss Xradia 520 Versa

Since late 2016, the Institute for Applied Materials (KIT) has an X-ray microscope (Xradia 520 Versa) with sub-μm resolution for 3D X-ray microscopy, which offers a spatial resolution below 0.7 µm with available voxel sizes …

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Instrument
Zeiss Xradia 810 Ultra (nanoCT)

NanoCT (Xradia Ultra 810 X-ray microscope) enables the non-destructive structural characterization of three-dimensional samples with resolution down to 50 nm. In this non-invasive X-ray microscopy technique, the sample is positioned in the focal spot of …

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