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Scanning Auger Microscope (SAM)

Site:

Hamburg

RESOLUTION (nm)
-   10.0  -
ENERGY (keV)
25.0
DETECTOR
PHI 710 Scanning Auger Nanoprobe

  • PHI 710 Scanning Auger Nanoprobe instrument
  • Energy range, electrons, 1-25 keV
  • Nominal lateral resolution < 10 nm (elements with low concentrations)
  • Coaxial cylindrical mirror analyser
  • Argon ion gun (5 kV) for surface cleaning, charge neutralization and Auger compositional depth profiling
  • Image registration to enhance imaging stability
  • Motorized five-axis specimen stage
  • Intro camera and ion gauge
  • Navigation software to re-localize pre-defined positions on the sample surface

Acquisition Parameter:

Image registration to enhance imaging stability


Helmholtz Imaging spinning wheel

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