Ultra-High Vacuum Analysis lab (UHV Lab)
The IPS UHV (ultra-high vacuum) Analysis lab operates a variety of instruments for surface analytics with several UHV growth chambers. Samples be analyzed by standard surface characterization methods such as:
- reflection high energy electron diffraction (RHEED),
- low-energy electron diffraction (LEED),
- Auger electron spectroscopy (AES),
- X-ray photoelectron spectroscopy (XPS),
- UHV atomic force microscopy (AFM),
- UHV scanning tunneling microscopy (STM).
The cluster comprises three chambers built with different materials for different purposes.
Weblinks
Ultra-High Vacuum Analysis lab in Helmholtz Imaging CONNECT:
No application found.
No instrument found.
No lab found.
No solution found.