Atomic Force Microscopy (AFM)
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Wikipedia contributors. "Atomic force microscopy." Wikipedia, The Free Encyclopedia. Wikipedia, The Free Encyclopedia, April 23, 2024.
Atomic force microscopy
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Read more about 'Atomic force microscopy' at: WikipediaWikipedia contributors. "Atomic force microscopy." Wikipedia, The Free Encyclopedia. Wikipedia, The Free Encyclopedia, April 23, 2024.
Atomic Force Microscopy in Helmholtz Imaging CONNECT:
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