Go back    Home Modalities Atomic Force Microscopy

Atomic Force Microscopy (AFM)

CC BY-SA 3.0 From Wikipedia on:

Atomic force microscopy

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

Read more about 'Atomic force microscopy' at: Wikipedia

Wikipedia contributors. "Atomic force microscopy." Wikipedia, The Free Encyclopedia. Wikipedia, The Free Encyclopedia, Nov. 1, 2022.
Atomic Force Microscopy Image

Please wait, your data is processed