Themis-Z

Site:

Karlsruhe

Double Corrected Analytical (S)TEM

Configuration

  • High Tension: 60, 80, 300 kV
  • X-FEG
  • Monochromator
  • Double aberration corrected (TEM and STEM)
  • Super-X EDX detector
  • BF-/seg. DF-/HAADF-STEM detector
  • Gatan Oneview IS camera
  • Gatan GIF Continuum 970 HighRes + K3 IS camera

Resolution

300 kV

Information Limit TEM [nm] : 0.06
Information Limit field-free TEM [nm]: 1.0
Resolution STEM [nm] : 0.059
Resolution field-free STEM [nm]: 4.0
EELS Energy Resolution [eV]: 0.135

80 kV

Information Limit TEM [nm] : 0.09
Resolution STEM [nm] : 0.08
EELS Energy Resolution [eV]: 0.135

60 kV

Information Limit TEM [nm] : 0.096
Resolution STEM [nm] : 0.1
EELS Energy Resolution [eV]: 0.135

Imaging and Analysis Techniques

  • BF-TEM & HRTEM
  • BF-/DF-/HAADF-STEM
  • 4D-STEM: DPC/iDPC/PDF
  • EFTEM, EELS, EDX Analysis
  • (S)TEM & EDX tomography
  • Electron diffraction
  • Lorentz imaging
  • Low-dose techniques & cryo imaging
  • AXON & Clarity in-situ integration

Access
Operated as part of the Karlsruhe Nano Micro Facility. Proposal based access; see:

Link: https://www.knmf.kit.edu/
Themis-Z Image

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