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Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)

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Time-of-flight mass spectrometry


Time-of-flight mass spectrometry (TOFMS) is a method of mass spectrometry in which an ion's mass-to-charge ratio is determined by a time of flight measurement. Ions are accelerated by an electric field of known strength. This acceleration results in an ion having the same kinetic energy as any other ion that has the same charge. The velocity of the ion depends on the mass-to-charge ratio (heavier ions of the same charge reach lower speeds, although ions with higher charge will also increase in velocity). The time that it subsequently takes for the ion to reach a detector at a known distance is measured. This time will depend on the velocity of the ion, and therefore is a measure of its mass-to-charge ratio. From this ratio and known experimental parameters, one can identify the ion.

Read more about 'Time-of-flight mass spectrometry' at: Wikipedia

Wikipedia contributors. "Time-of-flight mass spectrometry." Wikipedia, The Free Encyclopedia. Wikipedia, The Free Encyclopedia, April 13, 2024.
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