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Dual-beam Focused Ion Beam (Dual-Beam-FIB)

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Other modalities related to Dual-beam Focused Ion Beam in Helmholtz Imaging CONNECT:

Modality

Cryo focused ion beam (Cryo-FIB)

Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup …

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Modality

Focused ion beam (FIB)

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Modality

Focused ion beam scanning electron microscopy (FIB SEM)

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Dual-beam Focused Ion Beam in Helmholtz Imaging CONNECT:

Expert

Timo Christian

Deutsches Elektronen-Synchrotron - Hamburg

Project Manager for the Helmholtz Transfer Academy "Future Innovators". Interested in anything that can solve problems. Trying to unlock the potential of scientific development to also solve short-term problems of the real-world.

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➤Modalities: 237 ➤Applications: 152 ➤Instruments: 0 ➤Labs: 0 ➤Facilities: 36 ➤Centers: 1 ➤Solutions: 49

Application

3D slicing tomography

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Application

Cross section sample preparation

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Facility

DESY NanoLab

The DESY Nanolaboratory (DESY NanoLab) is a facility providing access to advanced nano-characterization, nano-structuring and nano-synthesis techniques which are complementary to the advanced X-ray techniques available at DESY’s lightsources. The DESY NanoLab consists of several …

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Facility

Karlsruhe Nano Micro Facility for Information-driven Material Structuring and Characterization (KNMFi)

KNMFi is a high-tech platform for information-driven structuring and characterizing a multitude of functional materials at the micro- and nanoscale.

The Karlsruhe Nano Micro Facility for Information-driven Material Structuring and Characterization (KNMFi) offers access to …

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Center

Deutsches Elektronen-Synchrotron (DESY)

DESY is one of the world’s leading accelerator centres. Researchers use the large-scale facilities at DESY to explore the microcosm in all its variety – from the interactions of tiny elementary particles and the behaviour …

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➤Applications: 152 ➤Facilities: 4 ➤Instruments: 21 ➤Labs: 86 ➤Modalities: 237 ➤Experts: 32 ➤Solutions: 4

Center

Karlsruher Institut für Technologie (KIT)

KIT is 'The Research University in the Helmholtz Association.' As one of the biggest science institutions in Europe, the only German University of Excellence with national large-scale research facilities combines a long university tradition with …

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➤Applications: 17 ➤Facilities: 6 ➤Instruments: 32 ➤Labs: 6 ➤Modalities: 53 ➤Experts: 16 ➤Solutions: 4

Instrument

Dual-beam Focused Ion Beam instrument - FIB

Detectors:
• SE Everhart-Thornley detector (ET-SED)
• In-lens detectors: Lower (T1) and Upper (T2)
• X-Max 150 EDS silicon drift detector for elemental analysis, energy resolution 127 eV @ MnKα (Oxford)
• IR-CCD camera to …

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➤Applications: 2 ➤Facilities: 1 ➤Centers: 1 ➤Labs: 0 ➤Modalities: 2 ➤Experts: 0 ➤Solutions: 2

Instrument

Strata 400 FIB (Strata 400)

FEI Strata 400 DualBeam FIB equipped with an Omniprobe micromanipulator, Oxford EDX system and GIS (Pt, W, C, SiO2).

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➤Applications: 0 ➤Facilities: 1 ➤Centers: 1 ➤Labs: 0 ➤Modalities: 4 ➤Experts: 1 ➤Solutions: 2

Instrument

Tescan Solaris X (Solaris X)

Tescan Solaris X DualBeam FIB equipped with Omniprobe micromanipulator and option for 3D Slice&View and TEM sample preparation.
The Tescan Solaris X, is a combination of a scanning electron microscope (SEM) and a focused ion …

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Instrument

Zeiss Auriga 60 (Auriga 60)

The Zeiss Auriga 60 Dual Beam FIB is a combination of a scanning electron microscope (SEM) and a focused ion beam (FIB) system, which allows imaging and structuring of materials at the nanoscale. It is …

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